Advances in Optics of Charged Particle Analyzers: Part 2 – PDF/EPUB Version Downloadable
Author(s): Peter W. Hawkes, Martin Hÿtch
Publisher: Academic Press
ISBN: 9780443317200
Edition:
$49,99
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Version: Only PDF Version.
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Description
Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
- Features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, and more
